Observing the quantity and distribution of conductive particles is essential to ensure they meet quality standards. This step is crucial for every LCD module manufacturer, as it directly affects product performance and reliability.
To effectively examine conductive particles, a metallographic microscope equipped with DIC (Differential Interference Contrast) and polarizing components is highly recommended. These features allow for better contrast and clarity, making it easier to identify and count the particles accurately.
It’s important to note that using a high-magnification lens, such as above 20x, may lead to a loss of depth of field, resulting in blurred images. Therefore, a moderate magnification of up to 20x is typically preferred to achieve the best visual results.
The Mingmei MJ33DIC metallographic microscope offers an excellent balance between cost-effectiveness and performance, making it an ideal choice for conducting precise observations of conductive particles.
Below is an image captured using the MJ33DIC microscope combined with our company's independently developed high-definition microscopic imaging system:
In this image, the red area represents a conductive particle, which is not visible under normal observation settings. The DIC technology helps highlight these small yet critical elements, ensuring accurate analysis and quality control.
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